Search results for: D. Flandre
2010 Proceedings of ESSCIRC > 518 - 521
Microelectronics Reliability > 2010 > 50 > 9-11 > 1852-1856
Solid State Electronics > 2010 > 54 > 2 > 104-114
Solid State Electronics > 2010 > 54 > 2 > 164-170
Solid State Electronics > 2010 > 54 > 2 > 213-219
Solid State Electronics > 2010 > 54 > 2 > 196-204
IEEE Sensors Journal > 2010 > 10 > 1 > 178 - 184
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1764 - 1770
Procedia Engineering > 2010 > 5 > Complete > 576-579
Procedia Engineering > 2010 > 5 > Complete > 540-543