The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We study the electric field (EF)-assisted magnetization switching in perpendicular magnetic free layer guided by an Oersted field using micromagnetic simulations. The EF is used to reduce the perpendicular magnetic anisotropy (PMA), and thus change the easy axis from the perpendicular to the in-plane. The Oersted field is used to guide the magnetization to the desired switching directions. The effects...
We investigate the switching of electric-field (EF)-controlled magnetic tunneling junction free layer (FL) magnetization assisted by Oersted field using OOMMF (Object Oriented Micro Magnetics Framework). The effects of several physical parameters, such as damping constant, magnetic anisotropy, as well as the EF efficiency and the applied Oersted field on the switching of the free layer magnetization...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.