Search results for: T. Shimizu
2011 International Reliability Physics Symposium > 2F.4.1 - 2F.4.6
IEEE Transactions on Dielectrics and Electrical Insulation > 2006 > 13 > 2 > 445 - 452
IEEE Transactions on Dielectrics and Electrical Insulation > 2006 > 13 > 2 > 319 - 326