Search results for: C. Guérin
Microelectronic Engineering > 2007 > 84 > 9-10 > 1938-1942
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 225 - 235
Microelectronic Engineering > 2007 > 84 > 9-10 > 1938-1942
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 225 - 235