Search results for: D. Misra
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 689 - 693
Microelectronic Engineering > 2007 > 84 > 9-10 > 2274-2277
Solid State Electronics > 2006 > 50 > 6 > 992-998
IEEE Electron Device Letters > 2006 > 27 > 8 > 688 - 691
Microelectronic Engineering > 2005 > 80 > Complete > 226-229