Search results for: T. Shimizu
2011 International Reliability Physics Symposium > 2F.4.1 - 2F.4.6
2007 IEEE International Electron Devices Meeting > 787 - 790
Materials Science & Engineering B > 1996 > 39 > 3 > 173-178
Thin Solid Films > 1996 > 276 > 1-2 > 104-107