Search results for: Y Kim
2016 IEEE International Electron Devices Meeting (IEDM) > 29.8.1 - 29.8.4
IEEE Transactions on Nuclear Science > 2016 > 63 > 2-1 > 543 - 547
IEEE Transactions on Nuclear Science > 2016 > 63 > 2-1 > 534 - 538
IEEE Sensors, 2005. > 4 pp.