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We present the experimental fact that, in a (110)‐oriented ZnTe single crystal, polariscopy is highly sensitive to the internal strain, comparing with Raman scattering spectroscopy. We utilized X‐ray topography and X‐ray diffraction analysis to thoroughly investigate the crystal structure that is intimately associated with the internal strain. The two X‐ray structure analyses clarified that the misalignment...
We have explored the effectiveness of applying the circular polariscopic measurement to the mapping of the strains in a semi‐insulating 6H‐SiC wafer. Initially, monochromatic Lang X‐ray topography, which is regarded as a fundamental evaluation technique for wafers, is applied. In the monochromatic Lang X‐ray topograph, the disappearance of the images is found in various areas, which suggests that...
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