Search results for: Fei-Yi Hung
Journal of Electronic Materials > 2017 > 46 > 7 > 4384-4391
Microelectronics Reliability > 2015 > 55 > 8 > 1256-1261
Microelectronics Reliability > 2015 > 55 > 3-4 > 608-612
IEEE Transactions on Advanced Packaging > 2010 > 33 > 1 > 58 - 63