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In the selenization process, the sputtered metallic precursors transformed into CIGS thin films, which were investigated by novel in-situ resistance measurement. Simultaneously, the crystal phases and thicknesses of the selenized thin films at various selenization temperatures are obtained by XRD and XRF, respectively. According to the analysis of phase evolutions and reaction characteristics, it...
In this paper, polycrystalline CuIn x Ga 1−x Se 2 (CIGS) thin film absorbers were prepared by selenizing electrodeposited (ED) precursors with two different levels of selenium content: rich in selenium and poor in selenium. Comparing the results obtained by X-ray fluorescence (XRF), X-ray diffraction (XRD), scanning electron microscopy (SEM) and illuminated current–voltage...
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