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The wear-out of flash-based Solid-State Drives (SSDs) is a main concern that significantly affects their reliability. One major parameter that accelerates SSD wear-out is the number of write-cycles committed to flash chips. The number of write-cycles in SSD-based disk subsystem is highly dependent on the erasure code implemented in Redundant Array of Independent Disks (RAIDs). In this paper, we investigate...
This paper presents a method for functional verification of HDL models of digital circuits. The method is based on a co-operation between a simulator and an emulator and utilizes the advantages of both simulation-based and emulation-based verification to form a fast co-verification approach. This is done by verifying the intensive time-consuming part of the circuit in the emulator and the non-synthesizable...
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