The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In recent years, the wafer nodes of semiconductor are getting smaller and narrower. In the view of the development trends in the semiconductor & semiconductor packaging technologies, the higher signal LO pin counts and thinner package are wide-spread applied on consumer electronics products (ex: Smartphone, Tablet devices or Digital cameras) as well as high performance network systems and high-end...
We propose a machine-learning-based fault diagnosis approach for condition monitoring on the constant-speed rotating machines via vibration signals. There are mainly five phases in our approach, i.e., vibration signal measurement, discrete-wavelet-transformation-based preprocessing, feature extraction, base-line encoding, and fuzzy neural network. The advantage of this approach can identify the condition...
In this investigation, normal and high speed ball shear test were used to evaluate the solder joint performance. Solder residual fracture mode is always being found in normal ball shear for low strain rate. The strength of solder balls are directly associated with their mechanical property in normal ball shear test. High speed ball shear provide a easier way to judge the solder joint performance at...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.