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Microsphere‐assisted microscopy allows the limit of the diffraction of light to overcome while being non‐invasive, full‐field, label‐free, and easy‐to‐implement. However, the observation of translucent samples remains difficult using a classical bright‐field illumination. In this work, a method is presented for the inspection of quasi‐transparent sub‐diffraction‐limited structures by using dark‐field...
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