Search results for: H. Lin
IEEE Electron Device Letters > 2017 > 38 > 9 > 1224 - 1227
Letters in Applied Microbiology > 63 > 1 > 3 - 10
2015 IEEE International Reliability Physics Symposium > 2D.2.1 - 2D.2.6
2013 IEEE International Reliability Physics Symposium (IRPS) > BD.3.1 - BD.3.5
2010 International Electron Devices Meeting > 19.7.1 - 19.7.4