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Analog-to-digital converters based on ΣΔ modulators are used in a wide variety of applications. Due to their inherent monotonous behavior, high linearity, and large dynamic range, they are often the preferred option for sensor and instrumentation. Offset and flicker noise are usual concerns for this type of applications, and one way to minimize their effects is to use a chopper in the front-end integrator...
This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated,...
In this paper, a general description of digital ADC calibration approaches in current state-of-the-art is presented, with particular emphasis in Pipeline converters. The study performs a classification of the existing techniques considering two basic aspects: a) the principle of operation and the particular errors which can be compensated after calibration, b) the process from which a measurement...
This paper presents practical implementations of test cores for analog and mixed-signal BIST. A sinewave generator for test stimulus generation, and a periodical signal characterization system for response evaluation are discussed. Integrated prototypes and experimental results are provided, and a prototype of a network/spectrum analyzer featuring both test cores has been developed and tested in the...
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