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This paper presents the design of an efficient buffering solution for BIST applications for static linearity test in high-speed high-performance ADCs. Relevant design trade-offs for buffer reusability are studied in a nanometric CMOS technology. The circuit is devised to isolate the on-chip generator output from the high-frequency switching noise at the sampling input of the ADC under test. This buffering...
This paper presents a self-testable BIST application for non-linearity test in high-speed high-performance ADCs in nanometric CMOS technologies. The technique makes use of an on-chip low-frequency signal generator optimized toward high accuracy, followed by a dedicated buffer based on a resistive feedback amplifier. This buffer has two main features: it isolates the on-chip generator output from the...
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