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The recursive filter (IIR) parallel programming on SIMD is more difficult than that of nonrecursive algorithms due to data dependency. Several transformation methods for parallel coding of IIR filter on SIMD have already been proposed to deal with data dependency. However, the inherent prologue and epilogue in these methods obviously increase the complexity of control structures and induce extra hardware...
This paper proposes a new BIST test pattern generation scheme based on random access scan architecture. In this scheme, segment-fixing strategy is used to BIST test pattern generator based on a counter, which can reduce the number of redundant test patterns, and improve the efficiency of test patterns generation. As random access scan mechanism is utilized in this scheme, only one scan cell needs...
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