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This paper presents a series of scalable equivalent circuits using an analytical method describing the electromagnetic coupling in the lightly doped CMOS substrate and the isolation structures such as the implanted guard ring. Implemented in Grace Semiconductor Manufacturing Corporation (GSMC) generic 0.13-$\mu$m RF CMOS technology, the measurement and full-wave simulation are carried out to verify...
This paper presents a compact model for p-minus substrate guard ring (psub GR) combined with p-plus guard ring (p+ GR) in lightly doped CMOS substrates. The model can be used to predict the noise suppression performance of psub GR in terms of S-parameters, which is useful for substrate noise mitigation in mixed-signal system-on-chips. The efficiency of the model has been validated by full wave electromagnetic...
This paper studied the wear behavior of plant abrasive to 60Si2Mn steel on wear test machine by different heat treatment processes, the samples' microstructures were analyzed by a metallurgical microscope, the samples' worn surface morphology was observed by a scanning electron micro-scope(SEM). The results show that: under the experimental conditions, 60Si2Mn steel abrasive wear is dominated by the...
The fault location method using traveling wave natural frequencies avoids the difficulty of identifying the arrival time of wave-front with good accuracy. However, the complicate bus-bar configuration and the source of signals should be taken into account in the implementation. The interference of different bus-bar configuration on the identification of dominant frequency is studied. The transient...
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