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The position of scanning acoustic microscopy (SCAM) in the context of destructive versus non-destructive analytical techniques is discussed. The principle of SCAM is touched briefly to a level which will allow an understanding of the various examples of application presented in this article. Examples of SCAM applications will be reported (a) on different types of non-destructive analysis such as:...
Prominent aims and general aspects of the analysis of thin films, interfaces and surfaces are reviewed. The terminology is presented, and a limited sketch displays the major techniques important in this field. Some topical subjects in thin film analysis are identified, starting from its application for support of technology. This leads to reflections upon some trends concerning both optimization...
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