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Structural evolution during crystallization of (00l)-oriented β-BaB 2 O 4 thin films fabricated by chemical solution deposition technique has been studied. The films were characterized by X-ray diffractometry (XRD), infrared spectroscopy (IR) and scanning electron microscopy (SEM). The results indicate that β-BaB 2 O 4 thin films crystallize in the temperature range...
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