Search results for: J. Huang
IEEE Electron Device Letters > 2015 > 36 > 4 > 294 - 296
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.3.1 - MY.3.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
IEEE Electron Device Letters > 2012 > 33 > 1 > 20 - 22
2007 IEEE International Electron Devices Meeting > 543 - 546