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Surface chiral formation of Cu films was investigated in the galvanostatic electrodeposition under a magnetic field of 5 T perpendicular to the electrode surface. The surface chirality was examined by electrochemical voltammograms of a chiral molecule of tartaric acid. The chiral induction depended on the magnetoelectrodeposition time, and this implied that the formation of the self-organized state...
We demonstrate the imaging of the extended defects in Si materials using a focused ion beam instrument. Since Ga-ion beam has small penetration depth and high channeling character compared with electron beam, the secondary electron signal of focused ion beam is more sensitive to the surface morphology and crystallinity. We have tried to use this secondary electron imaging of focused ion beam for observation...
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