Search results for: C. Vazquez
Journal of Electronic Testing > 2013 > 29 > 3 > 289-299
Analog Integrated Circuits and Signal Processing > 2012 > 70 > 2 > 249-263
Journal of Electronic Testing > 2013 > 29 > 3 > 289-299
Analog Integrated Circuits and Signal Processing > 2012 > 70 > 2 > 249-263