Search results for: Ying Chen
IEEE Electron Device Letters > 2016 > 37 > 4 > 496 - 499
IEEE Transactions on Reliability > 2015 > 64 > 1 > 197 - 205
2012 Oceans > 1 - 6
2010 Chinese Control and Decision Conference > 1036 - 1038
IEEE Transactions on Semiconductor Manufacturing > 2010 > 23 > 2 > 236 - 245