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Sulfur-induced degradation of the passive film on Alloy 800 in a simulated alkaline crevice (AKC) environment at 300 °C was evaluated using electrochemical impedance spectroscopy (EIS), scanning electron microscopy (SEM), secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), and Auger electron spectroscopy (AES). The reduced sulfur species (mainly S−2) from thiosulfate was...
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