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This work surveys our 2005-2009 experimental contributions to develop a combined altitude and underground test platform devoted to the soft-error rate (SER) characterization of deca-nanometer CMOS technologies. The platform currently involves two complementary sites to separate the component of the SER induced by the cosmic rays from that caused by on-chip radioactive impurities: the Altitude SEE...
This paper presents an analytical modeling of ballistic and quasi-ballistic transport, implemented in Verilog-A environment and used for circuit simulation. Our model is based on the Lundstrompsilas approach and uses an expression of the backscattering coefficient given by the flux method. The model takes also into account short channel effects and tales into account the effects of different scattering...
This work reports real-time soft-error rate (SER) testing of semiconductor static memories in both altitude and underground environments to separate the component of the SER induced by the cosmic rays (i.e. primarily by atmospheric neutrons) from that caused by on-chip radioactive impurities (alpha-particle emitters). Two European dedicated sites were used to perform long-term real-time measurements...
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