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It is difficult to obtain planar defects in aluminum due to its high stacking fault energy, in particular in submicron/micron Al grains. In this work we provide evidence for planar defects in submicron/micron Al grain of composites with multi nano-particles by transmission electron microscope observations. Nano-SiC particles (<100 nm) were found within micron-Al grains (>2 μm), while submicron...
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