Search results for: C. Bailey
Microelectronics Reliability > 2017 > 68 > C > 77-85
Microelectronics Reliability > 2015 > 55 > 9-10 > 1271-1279
Microelectronics Reliability > 2010 > 50 > 9-11 > 1706-1710
Microelectronics Reliability > 2007 > 47 > 1 > 132-141
Microelectronics Reliability > 2005 > 45 > 3-4 > 589-596
Microelectronics Reliability > 2003 > 43 > 4 > 625-633
Microelectronics Reliability > 2002 > 42 > 8 > 1205-1212