The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The stability of charges trapped by the single‐contact and repeated‐contact modes with atomic force microscopy (AFM) probe for polystyrene/cruciformed spiro [fluorene‐9,9′‐xanthene] (PS/SFXs) electret films is detected by Kelvin probe force microscopy (KPFM). The influences of the contact duration and number of contacts on the trapped charges are explored. We found that the contact duration and number...
The electrons and holes were injected into the blend electrets of polystyrene and C60 (PS/C60) by adjusting the biases of conductive atomic force microscopy probe. We visualized the charges trapping, release, diffusion, and retention processes of the PS/C60 electrets by utilizing the Kelvin Probe Force Microscopy (KPFM), and found that the localization and retention abilities of the ambipolar charges...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.