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Positron annihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM) analyses were adopted for in-depth (at the nanoscale level) and surface (at the microscale level) understanding of the swift heavy ions (SHI) irradiated and radiation exposed polymer films. Polyethyleneterephthalate (PET) polymer films were irradiated by 70 MeV C 5+ ions to the fluences ranging from 1 × 10...
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