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This paper reviews a method of correcting EPMA (electron probe microanalysis) and AES (Auger electron spectroscopy) signals from thin films for variations in substrate composition. In developing the fundamental expressions for the intensity of an Auger peak, it is usually assumed that the excitation (core level ionization) rate is constant with depth, at least within the detection volume for AES....
Calcium phosphate (CaP) coatings on Ti6Al4V substrate were elaborated by electrodeposition at different current densities (2, 5 and 10 mA/cm 2 ). The surface morphology and the chemical composition of the coatings were characterized by scanning electron microscopy associated to X-ray microanalysis (SEM-EDXS). However, these CaP coatings are irregular specimens (rough surface, porosity, variable...
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