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Rutherford Backscattering Spectrometry (RBS) using 6 MeV alpha particles and X-Ray Fluorescence (XRF) using a Pd-anode X-Ray generator were performed to characterize Au and Pt contacts deposited by electroless technique and thermal evaporation on differently treated surfaces of CdZnTe and CdTe crystals. The aim of this study is to understand and improve the structure of the material-electrode interface...
A technique for the determination of the partial pressures of Cd and Te2 vapors in equilibrium with CdZnTe crystals has been developed. The technique has shown a large range of applicability. First of all, the technique can be used for "in situ" monitoring the vapor partial vapor pressures in the case of technological relevant processes, such as material purification and crystal growth....
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