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We report the preparation of pure zinc oxide (ZnO) and nickel-doped zinc oxide thin films (∼100nm) by fast atom beam (FAB) sputtering technique and their characterisation in the perspective of transparent conducting oxide (TCO). Grazing angle X-ray diffraction (GAXRD) reveals that the films are polycrystalline, which has been further confirmed by selected area diffraction (SAD) studies. The nanogranular...
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