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Two types of nanoridge domains oriented with each other with an angle ranging between 109° and 124° were measured by scanning tunneling microscopy on the α-W film sputter deposited on an oxidized Si surface. Each domain contains nanoridges with a period of 7.5±1.0 nm. No such domains were observed on the β-W film surface. We argued that due to the anisotropy of the W(110) surface, the impinging W...
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