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An X‐ray reflectometer using a laboratory X‐ray source for quick measurements of the specular X‐ray reflectivity curve is presented. It uses a bent–twisted crystal to monochromatize and focus the diverging X‐rays (Cu Kα1) from a laboratory point source onto the sample. The reflected X‐rays are recorded with a two‐dimensional detector. Reflectivity curves can be measured without rotating the sample,...
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