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Morphological and electrical defects in polycrystalline silicon solar cells are distinguished by scanning electron acoustic microscopy (SEAM) and electron beam induced current (EBIC) techniques, respectively. It was found that while some defects are both morphologically and electrically detectable, some are predominantly only either electrical or morphological in nature. Combining both SEAM and EBIC...
Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways.
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