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This paper proposes the MHIC (Modified Hybrid Impedance Control) strategy of the redundant robot for ORU replacements based on the ground testbed. First, the operation process is analyzed and the corresponding strategies of ORU replacements are proposed. Then, based on the traditional hybrid impedance control method, MHIC of redundant robots is proposed achieving compliance or force tracking in different...
Wafer testing in the semiconductor industry is generally performed using a multilayer probe card. In this paper, Castigliano's second theorem is used to derive analytical formulae for the contact force and scrub mark length generated during the probing test. The formulations are then integrated with a multiobjective programming algorithm to optimize the probe needle parameters in such a way as to...
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