Search results for: J.P. Xu
Microelectronics Reliability > 2016 > 57 > C > 24-33
Microelectronics Reliability > 2016 > 56 > C > 17-21
Microelectronics Reliability > 2015 > 55 > 2 > 342-346
Microelectronics Reliability > 2014 > 54 > 2 > 393-396
Microelectronics Reliability > 2010 > 50 > 8 > 1081-1086
Microelectronics Reliability > 2009 > 49 > 8 > 912-915
Microelectronics Reliability > 2008 > 48 > 5 > 693-697
Microelectronics Reliability > 2008 > 48 > 4 > 526-530
Microelectronics Reliability > 2008 > 48 > 2 > 181-186
Microelectronics Reliability > 2008 > 48 > 1 > 23-28
Microelectronics Reliability > 2007 > 47 > 6 > 937-943
Microelectronics Reliability > 2007 > 47 > 2-3 > 391-394
Microelectronics Reliability > 2004 > 44 > 4 > 577-580
Microelectronics Reliability > 2003 > 43 > 1 > 163-166
Microelectronics Reliability > 1998 > 38 > 12 > 1925-1929
Microelectronics Reliability > 1998 > 38 > 9 > 1425-1431
Microelectronics Reliability > 1998 > 38 > 9 > 1407-1411