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Highly textured Ag/Al:Si back reflectors were used to improve the short-circuit current density of flexible nanocrystalline silicon thin-film solar cells by means of enhanced light trapping. A nanotextured topography with a root-mean-square (σrms) surface roughness of 60.1 nm was induced at low substrate temperature of 100°C by abnormal grain growth of dc-sputtered Al:Si films. After depositing highly...
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