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X-ray diffraction measurements with the use of both laboratory and synchrotron X-ray sources and transmission electron microscopy have been applied to study two types of GaN nanowires grown by plasma assisted molecular beam epitaxy on Si (001) substrates. Detailed structural analysis of the first type of nanowires reveals wurtzite type of GaN grown with the c-axis perpendicular to the substrate surface...
Dependence of strain distribution on Mg concentration in MgxZn1-xO layers on a-plane sapphire substrate grown by plasma-assisted molecular beam epitaxy was examined. Accurate determination of lattice parameters was performed using high resolution X-ray diffraction technique. Concentration of Mg was established by Rutherford backscattering spectrometry. These results show the non-linear relationship...
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