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An evolutionary method for analogue integrated circuits diagnosis is presented in this paper. The method allows for global parametric faults localization at the prototype stage of life of an analogue integrated circuit. The presented method is based on the circuit under test response base and the advanced features classification. A classifier is built with the use of evolutionary algorithms, such...
There is a method of global parametric faults location in analogue integrated circuits presented in this paper. Circuit Under Test is diagnosed in the time domain. The method is based on a utilisation of the tested device response and its derivative base features, i.e. following maxima and minima. The set consisted of base features is transformed into an advanced feature. Base features and the advanced...
A method of a global parametric faults diagnosis in analogue integrated circuits is presented in this paper. The method is based on basic features calculated from a circuit's under test time domain response to a voltage step, i.e. locations of maxima and minima of circuit under test response and its first order derivative. The testing and diagnosis process is executed with the use of an artificial...
This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier...
This paper presents an analysis of an influence of global parametric faults (GPF) on analogue integrated circuits (AIC) time domain (TD) response features, such as overshoot, delay time, rise time, maxima and minima, first differential maxima and minima. The novel approach is the analysis of relations and superrelations between features which are discussed in details. The presented results should...
W artykule przedstawiono analizę wpływu globalnych uszkodzeń parametrycznych na odpowiedź analogowych układów scalonych (AIC) w dziedzinie czasu. Nowością jest wykorzystanie relacji oraz super-relacji pomiędzy wcześniej wspomnianymi cechami odpowiedzi układów. Przedstawiona metoda powinna pozwolić na zwiększenie testowalności oraz diagnozowalności globalnych uszkodzeń parametrycznych (GPF) w produkcji...
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