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With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore nonrobust propagation conditions while emulating the failure analyzer's behavior...
Variations of power and ground levels affect very large scale integration circuit performance. Trends in device technology and in packaging have necessitated a revision in conventional delay models. In particular, simple scalable models are needed to predict delays in the presence of uncorrelated power and ground noise. In this paper, we analyze the effect of such noise-on-signal propagation through...
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