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The impact of parameter variations in integrated analog circuits is usually analyzed by Monte Carlo methods with a high number of simulation runs. Few approaches based on interval arithmetic were not successful due to tremendous overapproximations. In this paper, we describe an innovative approach computing transient and DC simulations of nonlinear analog circuits with symbolic range representations...
Shrinking microelectronic circuits leads to increasing parameter variations. Verification by Monte Carlo and worst case analysis has a limited reliability or requires a very high number of simulation runs. In this paper we give an overview of the semi-symbolic simulation approach. Compared to Monte Carlo and worst case analysis, the semi-symbolic simulation needs only a single simulation run to compute...
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