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We have compared the data retention of irradiated commercial NAND flash memories with that of unirradiated controls. For parts aged by baking at high temperature, there was a statistically significant difference between irradiated samples and unirradiated controls. For parts aged by repetitive Program/Erase (P/E) cycling, the effect of radiation was not statistically significant.
A low supply voltage low phase noise 10-GHz CMOS quadrature LC-VCO (LC-QVCO) is systematically analyzed and designed for low power applications in wireline and wireless communication systems. Using a semi-empirical model, the impacts on VCO oscillation magnitude, loaded quality factor (Qloaded), and oscillation frequency from the parasitic components of passive and active devices are formulated in...
This paper addresses a key concern of RFIC designers: RF device models are extracted from measurements of common source (CS) devices, but are used in un-common source (UCS) RFIC designs. As well as validating RF models in a complete functional IC, we also introduce flexible active building cells, i.e. intermediate merged cascode cells (MCC) and cross couple pairs (CCP). A good match between measurements...
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