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We report on investigations of photovoltaic response of Si-MOSFETs subjected to Terahertz radiation in high magnetic fields. The MOSFETs develop a dc drain-to-source voltage that shows singularities in magnetic fields corresponding to paramagnetic resonance conditions. These singularities are investigated as a function of incident frequency, temperature and two-dimensional carrier density. We tentatively...
The paper reviews different approaches of the semiconductor device and integrated circuit statistical modeling. A backward propagation of variance method has been used to estimate the EKV compact model parameter distributions. A detailed analysis of this approach has been done in terms of efficiency, and accuracy aspects. The determined distributions of the EKV model process parameters responsible...
FinFET devices are extensively investigated due to the prospects for application in the sub-100 nm CMOS integrated circuits fabrication. Small size of the FinFETs and the properties of technological processes strongly influence their electrical characteristics. The random variations of the characteristics lead to a mismatch effect critical from the viewpoint of design and fabrication. In the paper...
We consider global extraction of parameters of the MOSFET structure with the use of the EKV model. The extraction is defined as a task of minimizing the approximation error which is the discrepancy between the measured and model-generated I-V curves. As a result of the minimization, a set of parameter values is obtained where the minimum is observed. These values are treated as the extraction results...
The aim of this paper is extensive electrical characterization of MOS devices with ultrathin SiON gate dielectric. I-V characteristics are measured and basic transistor parameters (threshold voltage, DIBL, subthreshold swing and series S/D resistance) are extracted and their dependence on channel length investigated. Moreover, the dependence of gate current on channel length and the quality of the...
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