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In this study, Nd2Fe14B thin films with perpendicular anisotropy at the thickness as thin as 5 nm have been successfully prepared. The suitability of the films as perpendicular magnetic recording media has been discussed. The films were characterized by X-ray diffractometry (XRD), vibrating sample magnetometer (VSM) with maximum applied field 24 kOe, and scanning electron microscopy (SEM). The chemical...
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