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To guarantee that an application-specific integrated circuit (ASIC) meets its timing requirement, at-speed scan testing becomes an indispensable procedure for verifying the performance of ASIC. However, at-speed scan test suffers the test-induced yield loss. Because the switching-activity in test mode is much higher than that in normal mode, the switching-induced large current drawn causes severe...
To guarantee that an application specific integrated circuits (ASIC) meets its timing requirement, at-speed scan testing becomes an indispensable procedure for verifying the performance of ASIC. However, at-speed scan test suffers the test-induced yield loss. Because the switching activity in test mode is much higher than that in normal mode, the switching-induced large current drawn causes severe...
This paper illustrates the rectifier stress issue of the active clamped dual switch forward converters operating on discontinuous current mode (DCM), and analyzes the additional reverse voltage on the rectifier diode of active clamped dual switch forward converter at DCM operation, which does not appear in continuous current mode (CCM). The additional reverse voltage stress, plus its spikes, definitely...
Resonant reset soft switching dual switch forward dc-dc topology is suitable for topology standardization in power electronics system integration since which can be used in high voltage, wide range input applications. To further meet the miniaturization requirement for system integration, the soft switching principle of resonant reset soft switching dual switch forward dc-dc topology was discussed,...
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