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Memory arrays cannot be as easily tested as other storage elements. They can be considered as non-scan cells. Memory built-in self-test (MBIST), functional test, and macro test are used to test memory arrays. However, these techniques have relatively poor coverage of the timing critical paths. We propose path delay test through memory arrays using pseudo functional test with K Longest Paths Per Gate...
In this work, we address the problem of automatic test pattern generation for understanding circuit timing sensitivity to power supply noise (PSN) during post-silicon validation. Pseudo functional test patterns targeting the longest paths captured by each flip-flop are first generated. To determine the sensitivity to on-chip noise, the patterns are intelligently filled to achieve the desired PSN level...
Because of the applicability, sprayer equipment is widely used in the coal face. Considering that present spray equipments used in fully-mechanized face are very huge, inconvenient, expensive, fragile and of poor effect, it is subject to many restrictions on field applications. In response to these shortcomings, a new light sensor controllable onboard spraying dust-removal system in fully-mechanized...
A major difficulty affecting the control of product quality in industrial polymerization reactors is the lack of suitable on-line polymer property measurements. In this article, a predictive model of polymer properties is deduced for industrial polyethylene process based on the kinetics of ethylene polymerization. According to the approximation error upper bound of the deduced predictive model, a...
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