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Memory arrays cannot be as easily tested as other storage elements. They can be considered as non-scan cells. Memory built-in self-test (MBIST), functional test, and macro test are used to test memory arrays. However, these methods do not focus on the interaction between memory and surrounding logic, so may not cover timing critical paths. In this paper, we propose path delay test through memory arrays...
Memory arrays cannot be as easily tested as other storage elements. They can be considered as non-scan cells. Memory built-in self-test (MBIST), functional test, and macro test are used to test memory arrays. However, these techniques have relatively poor coverage of the timing critical paths. We propose path delay test through memory arrays using pseudo functional test with K Longest Paths Per Gate...
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