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We performed SEM, electric field-current density measurements, capacitance-voltage testing, and X-ray diffraction analysis to study the effects of indium doping on the microstructure and electrical properties of ZnO varistors co-doped with Ga2O3 and Y2O3. Our results showed that the residual voltage ratio of the sintered samples decreased with the introduction of indium at defined aluminum and yttrium...
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